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Microforce Sensing Probes

Nanomechanical Testing from pico-Newton to Newton

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USB-key sized MEMS-based microforce sensing probe for precise force measurement.
SEM image of microelectromechanical sensor for nanoscale force measurement.
Close-up of a Berkovich indenter tip for hardness testing.
Ruby spherical tip for testing soft materials' mechanical properties.

The  FT-S Microforce Sensing Probes are Micro-Electro Mechanical Systems (MEMS) based microforce sensors capable of measuring forces from 2 Newtons down to sub-nanonewtons (10-10 N) along the sensor’s probe axis. Both compression and tension forces can be measured. The outstanding long-term stability and low signal drift guarantees significantly higher measurement accuracy than any other force sensing system in this force range. The accuracy of the FemtoTools SI-traceable calibration process is ensured by comparative measurements with the Swiss National Institute of Metrology (METAS).

The Microforce Sensing Probes are available with a wide variety of tip materials and geometries including diamond Berkovich, cube corner, flat punch, wedge, conical and more.

Specifications


FT-S200

+/- 200 µN
Force range

 

500 pN
Force resolution (noise at 10Hz)

 


FT-S2’000

+/- 2 mN
Force range

 

5 nN
Force resolution (noise at 10Hz)

 

FT-S20’000

+/- 20 mN
Force range

 

50 nN
Force resolution (noise at 10Hz)

 

FT-S200’000

+/- 200 mN
Force range

 

500 nN
Force resolution (noise at 10Hz)

 

FT-S2’000’000

+/- 2 N
Force range

 

5 µN
Force resolution (noise at 10Hz)

 

Compatible Products

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iX05 nanoindenter, a standalone MEMS-based nanoindenter for material property analysis in a wide range of operando conditions: high-temperature nanoindentation. low-temperature nanoindentation, high strain rates nanoindentation ... iX05

Operando Nanoindentation

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FT-I04 Femto-Indenter, a standalone MEMS-based nanoindenter for material property analysis. i04

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FT-NMT04 Nanomechanical Testing System for precise in-situ SEM/FIB material analysis. NMT04

In-Situ Nanoindentation

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Side view of FemtoTools FT-MTA03 system highlighting its integrated microscope and precision sensing probe for microstructure analysis. MTA03

Soft-Material Nanoindentation

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